Modelando la  dinámica de un cantiléver de Microscopia de Fuerza Atómica AFM

J.  Matamoros; J. Vega-Baudrit

doi:10.54495/Rev.Cientifica.v23i1.114

Autores/as

J. Matamoros Laboratorio Nacional de Nanotecnología LANOTEC, Centro Nacional de Alta Tecnología, San José
J. Vega-Baudrit Laboratorio de Polímeros POLIUNA, Escuela de Química, Universidad Nacional de Costa Rica, Heredia

DOI:

https://doi.org/10.54495/Rev.Cientifica.v23i1.114

Palabras clave:

Simulación, dinámica, cantiléver, AFM

Resumen

Parte de la investigación científica actual involucra el empleo de diversas herramientas computacionales, tanto teóricas como de experimentación. La simulación computacional puede brindar acercamientos valiosos a la resolución de problemas científicos. La microscopía de fuerza atómica (AFM) constituye una de las técnicas de microscopía de sonda local; busca escanear las fuerzas interatómicas que pueden establecerse entre una muestra y una sonda. El movimiento oscilatorio del cantiléver se puede modelar matemáticamente utilizando los primeros armónicos de la ecuación de un oscilador armónico forzado con amortiguamiento. El hecho de que sea posible modelar matemáticamente permite que ambos comportamientos puedan ser programados y computados para la predicción del comportamiento físico a nivel teórico.

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